Study programme 2024-2025Français
Microscopies à sonde locale
Programme component of Master's in Physics (MONS) (day schedule) à la Faculty of Science

CodeTypeHead of UE Department’s
contact details
Teacher(s)
US-M2-SCPHYS-044-MOptional UELAZZARONI RobertoS817 - Chimie des matériaux nouveaux
  • LAZZARONI Roberto

Language
of instruction
Language
of assessment
HT(*) HTPE(*) HTPS(*) HR(*) HD(*) CreditsWeighting Term
  • Français
Français15000033.001st term

AA CodeTeaching Activity (AA) HT(*) HTPE(*) HTPS(*) HR(*) HD(*) Term Weighting
S-CHIM-047Scanning Probe Microscopy150000Q1100.00%

Programme component

Objectives of Programme's Learning Outcomes

  • Master expertise.
    • Have developed the knowledge and skills acquired in the previous cycle to a level that extends beyond the Bachelor's course in Physics, and which provides the basis for the development and implementation of original ideas in a professional context.
    • Have reached a level of knowledge and skill giving them access to the third cycle of the study programme / doctoral studies (only for two-year Master courses).
  • Provide clear and accurate information.
    • Share their knowledge and findings clearly and back them up rationally to specialist and non-specialist audiences.
  • Have a creative and rigorous scientific approach
    • Gather and interpret relevant scientific data and critically analyse it, distinguising working hypotheses of proven facts.

Learning Outcomes of UE

To acquire the theoretical and experimental concepts of scanning probe microscopies in terms of : (i) imaging, (ii) mapping of properties, and (iii) nanolithography and to get acquainted with the practical application of these concepts

UE Content: description and pedagogical relevance

- Scanning tunneling microscopy o General principles o Applications o Scanning tunneling spectroscopy - Atomic force microscopy o General presentation o Operation modes o Force curves o Experimental aspects - Other scanning force microscopies o Electrostatic force microscopy and derived techniques o Magnetic force microscopy - Scanning optical microscopies - Surface modifications with a local probe o Electrochemical nanolithography o Mechanically-induced modifications o Dip-pen lithography

Prior Experience

Not applicable

Type of Teaching Activity/Activities

AAType of Teaching Activity/Activities
S-CHIM-047
  • Cours magistraux
  • Préparations, travaux, recherches d'information

Mode of delivery

AAMode of delivery
S-CHIM-047
  • Face-to-face

Required Learning Resources/Tools

AARequired Learning Resources/Tools
S-CHIM-047Not applicable

Recommended Learning Resources/Tools

AARecommended Learning Resources/Tools
S-CHIM-047Not applicable

Other Recommended Reading

AAOther Recommended Reading
S-CHIM-047Not applicable

Grade Deferrals of AAs from one year to the next

AAGrade Deferrals of AAs from one year to the next
S-CHIM-047Unauthorized

Term 1 Assessment - type

AAType(s) and mode(s) of Q1 assessment
S-CHIM-047
  • Oral examination - Face-to-face

Term 1 Assessment - comments

AATerm 1 Assessment - comments
S-CHIM-047not applicable

Resit Assessment - Term 1 (B1BA1) - type

AAType(s) and mode(s) of Q1 resit assessment (BAB1)
S-CHIM-047
  • N/A - Néant

Term 3 Assessment - type

AAType(s) and mode(s) of Q3 assessment
S-CHIM-047
  • Oral examination - Face-to-face

Term 3 Assessment - comments

AATerm 3 Assessment - comments
S-CHIM-047Not applicable
(*) HT : Hours of theory - HTPE : Hours of in-class exercices - HTPS : hours of practical work - HD : HMiscellaneous time - HR : Hours of remedial classes. - Per. (Period), Y=Year, Q1=1st term et Q2=2nd term
Date de dernière mise à jour de la fiche ECTS par l'enseignant : 07/05/2024
Date de dernière génération automatique de la page : 18/01/2025
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Tél: +32 (0)65 373111
Courriel: info.mons@umons.ac.be